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Fundamentals of Electron and Ion Microscopy

13 декабря 2022 - 31 декабря 2024 г.
Курс уже начался
258 дней
До конца записи
  • Английский

    язык курса

  • 5 недель

    длительность курса

  • от 4 до 6 часов в неделю

    понадобится для освоения

  • 2 зачётных единицы

    для зачета в своем вузе

  • Стоимость 2 800 Р

    за обучение

Dear learners, please note that only part of the materials is available for free viewing. All course materials will be available after certification payment.

Electron and ion microscopy techniques are the most widespread tools for imaging and investigation of structural and functional properties of solid and soft matter on micro- and nanoscale, which applications are very broad: material science, microelectronics, nanotechnology, biology, forensics science and many others.

О курсе

This course represents the fundamentals on the working principles of all main components of the modern microscopes such as electron and ion optics as well as diverse signal detectors, on the physics of the particle interaction with the matter and of the image formation in different operation modes. The obtained knowledge will serve as basics for future practical usage of electron and ion microscopy as well as focused ion beam systems in various fields from basic research to industrial applications. A distinguished feature of the course is the consideration of both electron and ion beam technologies, which started to be rapidly growing due to the availability of recently industrially developed dual beam equipment, where these technologies are used jointly.

Формат

The form of education is distant. Weekly classes will include watching thematic video lectures, studying additional materials and completing test tasks with automated verification of results, testing on the material covered. To obtain a certificate, you must complete all tasks and tests.

Требования

This course may be of interest to bachelors, masters and graduate students of higher educational institutions, as well as to all those who are interested in the designated topic. 
The course will allow potential employees to receive evidence-based information that gives a competitive advantage in their own employment.

Программа курса

General Topics in Electron and Ion Microscopy

Scanning Electron Microscopy

Transmission Electron Microscopy

Scanning Ion Microscopy and Focused Ion Beams

Analysis in Electron Microscopy

Результаты обучения

After completing the course, students will be familiar with 

  • the fundamentals on the working principles of all main components of the modern microscopes such as electron and ion optics as well as diverse signal detectors
  • the fundamentals on the physics of the particle interaction with the matter and of the image formation in different operation modes
  • electron and ion beam technologies.

Формируемые компетенции

ПК-1. Способность понимать принципы работы и методы эксплуатации современной радиоэлектронной и оптической аппаратуры и оборудования 

ОПК-3. Способность использовать современные информационные технологии и программные средства при решении задач профессиональной деятельности, соблюдая требования информационной безопасности.

Направления подготовки

Отзывы о курсе

Петров Юрий Владимирович

Кандидат физико-математических наук
Должность: Доцент кафедры Электроники твердого тела Санкт-Петербургского государственного университета

Сертификат

По данному курсу возможно получение сертификата.

Стоимость прохождения процедур оценки результатов обучения с идентификацией личности - 2800 Р.

Программы, в которые включен курс

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