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Fundamentals of Electron and Ion Microscopy

13 December 2022 - 31 December 2024 г.
The course has already started
254 days
Before the end of the enrollment
  • English

    course language

  • 5 weeks

    course duration

  • от 4 до 6 часов в неделю

    needed to educate

  • 2 credit points

    for credit at your university

  • Cost 2 800 Р

    for studying

Dear learners, please note that only part of the materials is available for free viewing. All course materials will be available after certification payment.

Electron and ion microscopy techniques are the most widespread tools for imaging and investigation of structural and functional properties of solid and soft matter on micro- and nanoscale, which applications are very broad: material science, microelectronics, nanotechnology, biology, forensics science and many others.

About

This course represents the fundamentals on the working principles of all main components of the modern microscopes such as electron and ion optics as well as diverse signal detectors, on the physics of the particle interaction with the matter and of the image formation in different operation modes. The obtained knowledge will serve as basics for future practical usage of electron and ion microscopy as well as focused ion beam systems in various fields from basic research to industrial applications. A distinguished feature of the course is the consideration of both electron and ion beam technologies, which started to be rapidly growing due to the availability of recently industrially developed dual beam equipment, where these technologies are used jointly.

Format

The form of education is distant. Weekly classes will include watching thematic video lectures, studying additional materials and completing test tasks with automated verification of results, testing on the material covered. To obtain a certificate, you must complete all tasks and tests.

Requirements

This course may be of interest to bachelors, masters and graduate students of higher educational institutions, as well as to all those who are interested in the designated topic. 
The course will allow potential employees to receive evidence-based information that gives a competitive advantage in their own employment.

Course program

General Topics in Electron and Ion Microscopy

Scanning Electron Microscopy

Transmission Electron Microscopy

Scanning Ion Microscopy and Focused Ion Beams

Analysis in Electron Microscopy

Education results

After completing the course, students will be familiar with 

  • the fundamentals on the working principles of all main components of the modern microscopes such as electron and ion optics as well as diverse signal detectors
  • the fundamentals on the physics of the particle interaction with the matter and of the image formation in different operation modes
  • electron and ion beam technologies.

Formed competencies

ПК-1. Способность понимать принципы работы и методы эксплуатации современной радиоэлектронной и оптической аппаратуры и оборудования 

ОПК-3. Способность использовать современные информационные технологии и программные средства при решении задач профессиональной деятельности, соблюдая требования информационной безопасности.

Education directions

Отзывы о курсе

Петров Юрий Владимирович

Кандидат физико-математических наук
Position: Доцент кафедры Электроники твердого тела Санкт-Петербургского государственного университета

Certificate

It is possible to get a certificate for this course.

The cost of passing the procedures for assessing learning outcomes with personal identification - 2800 Р.

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